The goal of this textbook is to effectively equip readers with an in-depth understanding of crystallography, x-ray diffraction, and transmission electron microscopy theories as well as applications.
It is written as an introduction to the topic with minimal reliance on advanced mathematics.
Publisher: Taylor & Francis Ltd Author(s): Dong (Nanyang Technological University, Singapore) ZhiLi Number of pages: 272 Collection: Advances in Materials Science and Engineering Publication date: 2022 Dimensions: 241 x 159 x 23 Cover type: Hardback.
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